Degradation Signatures identification for stack operation diagnostics
DESIGN adresses the detection of slow and hidden phenomena that nevertheless have strong and detrimental long-term effects on the performance and durability of the SOFC stack. The project proposes to study the influence of slowly-damaging conditions on measures performed on the stack sub-components: the Cells and the Single Repeating Units (SRU) and on small stacks. Identification of characteristic signatures of these degradation phenomena at the lower level will be subsequently transposed at the stack level, to provide a way to diagnose slow degradation phenomena in a commercial SOFC stack, through appropriate data processing of measures provided by a limited amount of sensors.
The main outputs of the project will be :
1 - Identification of relevant sensors and signals to be monitored to diagnose full stack degradation phenomena;
2 - A data analysis methodology to be applied to measured signals;
3 - A set of characteristic signatures for the different degradation phenomena at the local and stack level, to be compared with the actual sensor signal to diagnose long-term degradation conditions;
4 - Recommendations for operation recovery, once a degradation condition is identified at the cell, SRU or stack level.
These recommendations could feed into a diagnostic tool such as the one that will be developed in the GENIUS project and focusing on system level diagnostic tool.